Laboratory for Electrical Measurements
The Laboratory for Electrical Measurements provides the equipment for a wide range of possible measurements in the field of electrical characterization of materials, both in the form of thin films and bulk materials.
Primarily, it enables the ability to measure the dielectric spectra in the frequency range of 20Hz-100MHz at temperatures ranging between -150°C to +600°C for bulk materials and -50 to +200°C for thin films.
Additionally, in the same temperature ranges it provides the ability to measure ferroelectric hysteresis (0.1Hz to 5kHz and 0.1V-200V) and IV curves (up to 1kV) as well as basic DC characterization (resistivity, sheet resistivity (van der Pauw method), leakage current).
It also includes a VNA for characterization of materials in the microwave range (10MHz-67GHz), which is available for bulk materials (25°C to 100°C), thin films (-50 to + 200°C) and liquid/soft samples (25°C-75°C).
Related equipment
Heat flow meter (StiroLab, LM.PLUS 305 )
Person responsible: David Fabijan
Measuring the thermal conductivity of thermally insulating bulk materials
Technical details
- 1 -800mW/m.K
- Minimal sample size (XY) 50mm x 50mm, no maxium
- Sample height 2-55mm
- 0-45°C
- 1% base accuracy
Multimeter (Keysight, 34470A)
Person responsible: David Fabijan
For high precision voltage, current and resistance measurements.
Technical details
- 7.5 digit, 50k readings/s
- AC/DC voltage and current, 2-4 point resistance, frequency and temperature measurements
- 1000V, 10GΩ and 10A max rating
Source measurement unit (Keithley, 2470 SMU)
Person responsible: David Fabijan
For determining the energy consumption and I-V characteristics of various devices.
Technical details
- max 1100V or 1A
- 6.5 digit accuracy down to a range of 10fA or 100nV
- 4 quadrant measurements
- automatic I-V loop measurements
Impedance analyzer (Keysight, E4990A)
Person responsible: David Fabijan
Fast dielectric measurement system for solid and semi-solid bulk materials as well as thin films.
Technical details
- 20Hz to 120MHz range with 1mHz frequency resolution
- 25mΩ to 40MOΩ impedance range
- ±40V or ±100mA built in DC bias
Ferroelectric test system (Radiant Technologies, Precision LC 200V)
Person responsible: David Fabijan
Measuring of PE loops and IV curves, primarily for (anti)ferroelectic materials.
Technical details
- For measurements of hysteresis loops, pulse polarization, fatigue, ageing, leakage and resistance as well as piezoelectric characteristics
- Hysteresis-loop frequency: max. 2 kHz
- Temperature interval: -170 - 200°C (Delta chamber)
Probe station (Cascade, Tesla Summit 12K)
Person responsible: David Fabijan
Connecting of various electrical characterization tools to thin film samples or other micro devices.
Technical details
- Probes for 2 and 4 point DC and radio frequency measurements
- GSG micorwave probes for up to 67GHz
- -55-200°C temperautre range
- Automatic sample movements
- Digital microscope
Financed by: Center of excellence in Nanoscience and Nanotechnology
Vector network analyzer (Agilent, PNA E8361C)
Model: Agilent Technologies ONA E8361C
Person responsible: David Fabijan
Characterization of complex permittivity of thin films and bulk materials in the microwave frequency range.
Technical details
- Frequency range: 10 MHz - 67 GHz
- Temperature interval: 20 – 60 °C
- Transmission, reflection and resonance measurement setups available
Financed by: Center of excellence in Nanoscience and Nanotechnology
LCR meter (Agilent, 4284A)
Person responsible: David Fabijan
Used for measuring inducatance, capacitance and resistance of passive components. The most common use is for measuring the complex dielectric permittivity of bulk samples and thin films. Combined wiht a data acquisition unit and thermal chambers
Technical details
- Frequency range: 20 Hz - 1 MHz
- 0.05% basic accuracy
- Up to 4 samples at once (with multiplexing)
- Temperature interval: - 170 °C - 300 °C (Delta 9039) and 30 °C - 700 °C (Nabertherm)
Piezometer (Piezotest PM-300)
Person responsible: David Fabijan
Piezotest PM-300 device, based on the Berlincourt method of direct measurements. Measures piezoparameters of bulk ceramic materials and polymer films.
Technical details
- Enables the measurement of d33, d31, d15, g33, g31 and g15 parameters
- A wide measurement range of 0.01-999 pC/N
- Programmable excitation range of 10-300Hz at 0.05-0.5N
Oscilloscope (Keysight, MSOX3034T)
Person responsible: David Fabijan
Used for a wide range of easily customizable measurements of piezoelectric and ferroelectric materials as well as characterization and modification of electronic devices.
Technical details
- Enables the inspection of up to 4 analog and 16 digital channels
- Bandwidth of 350MHz and a sampling rate of 5GSa/s
- Built in 2MHz function generator