Laboratory for X-Ray Diffraction (XRD)

Laboratory for X-ray diffraction is used for analysis of powders, bulk samples and thin films.

Types of analyses:

  • Qualitative and quantitative phase analysis and crystal structure determination of powders and bulk samples (Bruker AXS D4 Endeavor)
  • Qualitative and quantitative phase analysis and crystal structure determination of powders, bulk samples and thin films in ambient and non-ambient conditions (Malvern PANalytical Empyrean)
  • X-ray reflectometry for determining thickness, density and roughness of thin films and heterostructures (Malvern PANalytical Empyrean)

laboratory for x ray diffraction

Related equipment

Bruker D4 Endeavor X-ray diffraction diffractometer

XRD Bruker diffractometer (BRUKER AXS D4 ENDEAVOR)

Person responsible: Assoc. Prof. Dr. Srečo Davor Škapin

For qualitative and quantitative phase analysis and crystal structure determination of powders and bulk samples.

Technical details

  • X-ray tube Siemens KFL Cu-Ka (50 kV, 50 mA, 2.4 kW) with line focus 12 mm x 0.1 mm
  • Primary and secondary radius: 200.5 mm
  • Receiving slit width: 0.1 mm
  • Receiving slit length: 12 mm
  • Primary soller angle: 2.3 °
  • Secondary soller angle: 2.3 °

Malvern Panalytical Empyrean X-ray diffraction diffractometer

XRD Panalytical diffractometer (Malvern PANalytical, EMPYREAN)

Person responsible: Dr. Špela Kunej

For phase analysis and structural characterization of samples - thin films, bulk samples and powders. For more advanced XRD measurements - RSM, rocking curve, grazing incidence, etc. X-ray reflectometry - for determining the thickness, density and roughness of thin-films and heterostructures. High-and low temperature chambers for measurements in different ambients.

Technical details

  • Cu anode
  • Operating voltage/current: 45 kV/40 mA
  • Possibility of line or point focus
  • Maximum usable goniometer range: -111 < 2θ < 168°
  • Ambient sample stages: flat stage for solid samples, reflection-transmission spinner, 5-axis cradle
  • Non-ambient sample stages: Anton Paar HTK1200N (oven) for measurements up to 1200 °C, Oxford PheniX cryostat for measurements down to -261 °C
  • Area detector: PIXcel3D, 256 x 256 pixels of 55 μm


*Financed by NANOCENTER.