Dr. Špela Kunej
Research associate
- Phone: +386 1 477 3294
- Room: K936
- Email: spela.kunej@ijs.si
- Find more on COBISS
Biography
My current research interests lie in areas of synthesis/processing, crystallization, epitaxial growth, microstructure and functional properties of thin film materials obtained from solution-based methods, with a focus on novel composite material, dielectric, tunable and ferroelectric thin films. Past research were in areas of the solid-state reaction, phase relationships, solid solutions, new phase identification, microstructure and electrical characterization of ceramic materials in systems Bi2O3-TiO2, Bi2O3-ZnO, Bi2O3-TiO2-Nd2O3, Bi2O3-TiO2-Y2O3, and La2O3-TiO2-Mn2O3.
Research interests
• Ceramic materials based on Bi-compounds, such as sillenites Bi12SiO20, pyrochlore: Bi(1.6-1.08x)NdxTi2O(6.4-0.11x) in Bi(1.6-0.8x)YxTi2O(6.4+0.3x), preovskite: Na0.5Bi0.5TiO3-NaTaO3,
• Metallographic preparation of ceramic samples and thin films for optical, scanning electron microscopy and transmission electron microscopy,
• Scanning electron microscopy (SEM) with energy-dispersive spectroscopy (EDS) and wavelength-dispersive spectroscopy (WDS),
• X-ray powder diffraction (XRD),
• Phase and structural characterization of compounds using crystal structure identification programs: EVA and Topaz R,
• Atomic force microscopy (AFM): operation,
• Thermal analysis (TG/DTA/DSC/EGA),
• Heating microscope,
• Electrical characterization of ceramic bulk samples and thin films.
• Metallographic preparation of ceramic samples and thin films for optical, scanning electron microscopy and transmission electron microscopy,
• Scanning electron microscopy (SEM) with energy-dispersive spectroscopy (EDS) and wavelength-dispersive spectroscopy (WDS),
• X-ray powder diffraction (XRD),
• Phase and structural characterization of compounds using crystal structure identification programs: EVA and Topaz R,
• Atomic force microscopy (AFM): operation,
• Thermal analysis (TG/DTA/DSC/EGA),
• Heating microscope,
• Electrical characterization of ceramic bulk samples and thin films.