Seminar III (Dejan Klement): Thin Film Analysis by X-Ray Scattering: Case Study of SrTiO3 Films on Si Substrate

The Seminar III of Dejan Klement entitled "Thin Film Analysis by X-Ray Scattering: Case Study of SrTiO₃ Films on Si Substrate", will be on Tuesday, September 30^th, 2015, at 13:00 at the K9 Seminar room.