Equipment for electrical characterization



Piezotest PM-300 device, based on the Berlincourt method of direct measurements.

•    Measures piezoparameters of bulk ceramic materials and polymer films
•    Enables the measurement of d33, d31, d15, g33, g31 and g15 parameters
•    A wide measurement range of 0.01-999 pC/N
•    Programmable excitation range of 10-300Hz at 0.05-0.5N



Keysight MSOX3034T digital oscilloscope.

•    Used for a wide range of easily customizable measurements of piezoelectric and ferroelectric materials as well as characterization and modification of electronic devices.
•    Enables the inspection of up to 4 analog and 16 digital channels
•    Bandwidth of 350MHz and a sampling rate of 5GSa/s
•    Built in 2MHz function generator

sistem za merjenje dielektričnih lastnosti

System for dielectric properties measurements

LCR meter Agilent Technologies 4284A equipped with Data Acquisition Switch Unit, a temperature chamber Delta 9039 and a furnace Nabertherm.

  • For measurements of dielectirc properties in the radio-frequency region.
  • Frequency range: 20 Hz - 1 MHz
  • Temperature interval: - 170 °C - 300 °C (Delta 9039) and 30 °C - 700 °C (Nabertherm)

Mrežni analizator + Nanocenter

System for microwave properties measurements

Microwave network analyzer Agilent Technologies ONA E8361C equipped with a time domain, extended DC range, electronic calibration system, different systems for materials characterization and temperature chamber Ultra 2000.

  • Enables dielectric properties measurement in the microwave region. For the characterization of thin films the “split post” dielectric resonator is used.
  • Frequency range: 10 MHz - 67 GHz
  • Temperature interval: 20 – 60 °C
  • Transmission and reflection measurements
  • Software support: Microwave studio.
  • Financed by: Center of excellence in Nanoscience and Nanotechnology

Power station+Nanocenter

Power device characterization system

Semi-automatic power device characterization system Cascade Microtech Tesla, on the basis of Summit 12K, equipped with an optical system, temperature chamber and with radio frequency, microwave and high-voltage probes.

  • Enables connection with network analyzer, LCR meter and ferroelectric test system, and characterization of electrical properties of thin films.
  • Frequency range: max. 67 GHz
  • Temperature interval: - 55 – 200 °C
  • Max. substrate dimension: 200 mm
  • Financed by: Center of excellence in Nanoscience and Nanotechnology