Equipment for electrical characterization

sistem za merjenje dielektričnih lastnosti

System for dielectric properties measurements

LCR meter Agilent Technologies 4284A equipped with Data Acquisition Switch Unit, a temperature chamber Delta 9039 and a furnace Nabertherm.

  • For measurements of dielectirc properties in the radio-frequency region.
  • Frequency range: 20 Hz - 1 MHz
  • Temperature interval: - 170 °C - 300 °C (Delta 9039) and 30 °C - 700 °C (Nabertherm)

Mrežni analizator + Nanocenter

System for microwave properties measurements

Microwave network analyzer Agilent Technologies ONA E8361C equipped with a time domain, extended DC range, electronic calibration system, different systems for materials characterization and temperature chamber Ultra 2000.

  • Enables dielectric properties measurement in the microwave region. For the characterization of thin films the “split post” dielectric resonator is used.
  • Frequency range: 10 MHz - 67 GHz
  • Temperature interval: 20 – 60 °C
  • Transmission and reflection measurements
  • Software support: Microwave studio.
  • Financed by: Center of excellence in Nanoscience and Nanotechnology

Power station+Nanocenter

Power device characterization system

Semi-automatic power device characterization system Cascade Microtech Tesla, on the basis of Summit 12K, equipped with an optical system, temperature chamber and with radio frequency, microwave and high-voltage probes.

  • Enables connection with network analyzer, LCR meter and ferroelectric test system, and characterization of electrical properties of thin films.
  • Frequency range: max. 67 GHz
  • Temperature interval: - 55 – 200 °C
  • Max. substrate dimension: 200 mm
  • Financed by: Center of excellence in Nanoscience and Nanotechnology

feroelektrični testni sistem

Ferroelectric test system

Radiant Technology Precision LC 10V, connected with an external amplifier Trek 609A-3 and a photonic sensor MTI-2000.

  • For measurements of hysteresis loops, pulse polarization, fatigue, ageing, leakage and resistance as well as piezoelectric characteristics.
  • Hysteresis-loop frequency: max. 250 Hz
  • Amplification: 1000x
  • Temperature interval: -170 - 200°C (Delta chamber)

sistem za merjenje električne prilagodljivosti

System for electric-field tunability measurements

The system includes DC-bias source, amplifier, LCR meter and bias tee (Picoseconds 5531).

  • The system includes DC-bias source, amplifier, LCR meter and home-made AC and DC bias connectors.
  • For determination of DC-bias dependence of dielectric properties, suitable for bulk materials.
  • DC current: max. 3 kV
  • Measurement frequency: max. 1MHz
  • Temperature interval: -170 - 200°C (Delta chamber)