X-ray diffractometer (EMPYREAN)
In the scope of the Center of Excellence in Nanoscience and Nanotechnology we installed Empyrean X-ray diffractometer at Advanced Materials Depatment, which is utilized mainly for detailed structural characterization of single-cystalline thin films. The delivered system enables the study of epitaxial layers in terms of reciprocal space-map measurements and determination of epitaxial relationship with respect to the substrate, while the reflectivity measurements provide us information about the thickness, surface/interface roughness and density of single or multilayered structures on substrate. The above mentioned applications of the system are enabled by sample stage with 5 computer controlled and programmable axes and very powerful 2D area detector, capable of measuring in 0D mode (standard point detector), 1D mode (fast linear detector) and 2D mode (area detector). In addition to structural characterization of thin films standard powder diffraction measurements can also be performed, optionally with diffracted beam monochromator for sample fluorescence removal. Furthermore, the system is equipped with high/low temperature sample stages, which enable measuring samples in a broad temperature range from -261 °C to 1200 °C and different gas atmospheres.